• DocumentCode
    1040047
  • Title

    Techniques for Memory Testing

  • Author

    Crafts, James M.

  • Author_Institution
    Teradyne, Inc.
  • Volume
    12
  • Issue
    10
  • fYear
    1979
  • Firstpage
    23
  • Lastpage
    31
  • Abstract
    Semiconductor memory production relies hedvily on test technology. One testing technique—real-time bit mapping—offers more advantages than any other.
  • Keywords
    Flash memory; Life testing; Lithography; Process design; Product design; Random access memory; Semiconductor device testing; Semiconductor memory;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/MC.1979.1658492
  • Filename
    1658492
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1040047