Title :
Automatic Analog Testing - 1979 Style
Author_Institution :
Honeywell Incorporated
Abstract :
The bewildering changes currently facing designers and users of analog test equipment are leading to new techniques and improved hardware that should reduce test time by a factor of four within the next decade.
Keywords :
Analog circuits; Automatic testing; Circuit testing; Digital circuits; Distortion measurement; Electronic equipment testing; Life testing; Performance evaluation; System testing;
DOI :
10.1109/MC.1979.1658496
