• DocumentCode
    1040071
  • Title

    Automatic Analog Testing - 1979 Style

  • Author

    Plice, W.A.

  • Author_Institution
    Honeywell Incorporated
  • Volume
    12
  • Issue
    10
  • fYear
    1979
  • Firstpage
    40
  • Lastpage
    47
  • Abstract
    The bewildering changes currently facing designers and users of analog test equipment are leading to new techniques and improved hardware that should reduce test time by a factor of four within the next decade.
  • Keywords
    Analog circuits; Automatic testing; Circuit testing; Digital circuits; Distortion measurement; Electronic equipment testing; Life testing; Performance evaluation; System testing;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/MC.1979.1658496
  • Filename
    1658496
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1040071