Title :
Relationship of some processing variables to plated-wire memory properties
Author_Institution :
Lockheed Electronics Company, Los Angeles, Calif.
fDate :
9/1/1969 12:00:00 AM
Keywords :
NDRO memories; Plated-wire memories; Coatings; Copper; Creep; History; Magnetic properties; Oscilloscopes; Solids; Testing; Wire; Writing;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1969.1066502
