Title :
Mapping magnetic properties of flat films by continuous magnetooptical scanning
Author :
Gallet, F. ; Marx, James ; Leroy, J.
Author_Institution :
Bull General Electric, Paris, France
fDate :
9/1/1969 12:00:00 AM
Keywords :
Magnetic films; Magnetic measurements; Magnetooptic effects; Feedback; Frequency; Magnetic anisotropy; Magnetic films; Magnetic flux; Magnetic properties; Magnetooptic effects; Perpendicular magnetic anisotropy; Potentiometers; Testing;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1969.1066514