DocumentCode :
1040442
Title :
Magnetic field measurements in the scanning electron microscope
Author :
Thornley, Richard F M ; Hutchison, Jack D.
Author_Institution :
IBM Corporation, Boulder, Colo.
Volume :
5
Issue :
3
fYear :
1969
fDate :
9/1/1969 12:00:00 AM
Firstpage :
271
Lastpage :
275
Abstract :
Local magnetic fields emanating from recording tapes and heads have been measured by observing their effect on the beam of a scanning electron microscope. Theoretical calculations indicate that tape fields recorded at densities up to 25 000 flux reversals/inch should be observable. A variation on the basic technique, using the astigmatic aberration of the electron beam, can be used to measure field gradients directly.
Keywords :
Magnetic field measurement; Magnetic recording heads; Magnetic tape materials; Scanning electron microscopy; Electron beams; Electron optics; Geometry; Magnetic field measurement; Magnetic fields; Magnetic force microscopy; Magnetic heads; Magnetic recording; Scanning electron microscopy; Shape measurement;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1969.1066539
Filename :
1066539
Link To Document :
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