• DocumentCode
    1040570
  • Title

    F-3 Lead Alloy Cable Sheath-Effect of Bending and Creep on Life

  • Author

    Hickernel, L.F. ; Jones, L. A A ; Snyder, C.J.

  • Author_Institution
    Anaconda Wire and Cable Company, Hastings-on-Hudson, N. Y.
  • Volume
    70
  • Issue
    2
  • fYear
    1951
  • fDate
    7/1/1951 12:00:00 AM
  • Firstpage
    1273
  • Lastpage
    1285
  • Abstract
    The extensive tests reported herein have provided additional data on cable-sheath performance characteristics which readily can be applied to design practice by published methods.8,9,10 These data indicate: 1. Bending strain is the important consideration in determining sheath life of expansion loops in manholes. 2. If bending strains are low (cables of small diameter, lightly loaded, or cables in large manholes permitting large training radii), copper-lead or thin-wall alloy sheaths are satisfactory. 3. As cable diameter or loading increases, other factors being equal, strain increases. 4. Small expansion loops in restricted manholes increase the strain. 5. If bending strain exceeds a certain value, copper-lead will have a short life, and alloy sheaths should be used. 6. If the maximum permissible strain for standard alloy sheath is exceeded, additional strain resistance is best obtained by increased sheath thickness. 7. If bending strains are too high, the sheath increases in diameter, develops wrinkles and may fail from expansion rather than bending fatigue. 8. Thin-wall sheaths, in addition to lower resistance to bending and internal pressure, tend to wrinkle from handling. These wrinkles may cause stress concentrations and nonuniform bending resulting in short sheath life. 9. F-3 alloy is further substantiated as a superior sheathing material by this extension of previously published data.
  • Keywords
    Cable shielding; Capacitive sensors; Communication cables; Copper alloys; Creep; Fatigue; Lead; Stress; Testing; Thin wall structures;
  • fLanguage
    English
  • Journal_Title
    American Institute of Electrical Engineers, Transactions of the
  • Publisher
    ieee
  • ISSN
    0096-3860
  • Type

    jour

  • DOI
    10.1109/T-AIEE.1951.5060558
  • Filename
    5060558