• DocumentCode
    1040619
  • Title

    Guest Editors´ Introduction: Advances in VLSI Testing at MultiGbps Rates

  • Author

    Ivanov, A. ; Lombardi, F. ; Metra, C.

  • Author_Institution
    University of British Columbia
  • Volume
    21
  • Issue
    4
  • fYear
    2004
  • Firstpage
    274
  • Lastpage
    276
  • Abstract
    Presents the guest editorial for this issue of the publication.
  • Keywords
    Built-in self-test; Costs; Digital systems; Electronics industry; Environmental economics; Jitter; Manufacturing; Product development; System testing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2004.31
  • Filename
    1316773
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1040619