• DocumentCode
    1040641
  • Title

    Multiplexing ATE channels for production testing at 2.5 Gbps

  • Author

    Keezer, David C. ; Minier, Dany ; Caron, Marie-Christine

  • Author_Institution
    Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    21
  • Issue
    4
  • fYear
    2004
  • Firstpage
    288
  • Lastpage
    301
  • Abstract
    We describe two versions of a multiplexing test system for multigigahertz devices. Our approach leverages test resources available in existing ATE, and achieves higher rates with added multiplexing logic. In the prototype, 32 high-speed differential-pair signals each support data at 2 Gbps to 2.5 Gbps. An updated system uses water cooling to better maintain the test electronics temperature. This system also has improved relays for better signal integrity, and better embedded calibration circuits to obtain stable operation at 2.5 Gbps. The production version is scalable to as many as 144 high-speed differential-pair signals. Integral to the design are embedded circuits that support automated, accurate timing calibration with 10-ps resolution.
  • Keywords
    automatic test equipment; calibration; embedded systems; integrated circuit testing; logic testing; multiplexing; embedded calibration circuits; high-speed differential-pair signal; multigigahertz devices; multiplexing ATE channel; multiplexing test system; signal integrity; test electronics temperature; Calibration; Circuits; Electronic equipment testing; Electronics cooling; Logic devices; Logic testing; Production; Prototypes; System testing; Water resources;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2004.37
  • Filename
    1316776