DocumentCode
1040641
Title
Multiplexing ATE channels for production testing at 2.5 Gbps
Author
Keezer, David C. ; Minier, Dany ; Caron, Marie-Christine
Author_Institution
Georgia Inst. of Technol., Atlanta, GA, USA
Volume
21
Issue
4
fYear
2004
Firstpage
288
Lastpage
301
Abstract
We describe two versions of a multiplexing test system for multigigahertz devices. Our approach leverages test resources available in existing ATE, and achieves higher rates with added multiplexing logic. In the prototype, 32 high-speed differential-pair signals each support data at 2 Gbps to 2.5 Gbps. An updated system uses water cooling to better maintain the test electronics temperature. This system also has improved relays for better signal integrity, and better embedded calibration circuits to obtain stable operation at 2.5 Gbps. The production version is scalable to as many as 144 high-speed differential-pair signals. Integral to the design are embedded circuits that support automated, accurate timing calibration with 10-ps resolution.
Keywords
automatic test equipment; calibration; embedded systems; integrated circuit testing; logic testing; multiplexing; embedded calibration circuits; high-speed differential-pair signal; multigigahertz devices; multiplexing ATE channel; multiplexing test system; signal integrity; test electronics temperature; Calibration; Circuits; Electronic equipment testing; Electronics cooling; Logic devices; Logic testing; Production; Prototypes; System testing; Water resources;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2004.37
Filename
1316776
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