Title :
Electron probe analysis of recording surfaces
Author :
Morrison, Jim ; Speliotis, D.
Author_Institution :
Memorex Corporation, Santa Clara, Calif.
fDate :
9/1/1969 12:00:00 AM
Keywords :
Magnetic film memories; Magnetic tape materials; Density measurement; Electromagnetic measurements; Electron beams; Magnetic field measurement; Magnetic properties; Magnetic recording; Optical surface waves; Probes; Surface topography; Thickness measurement;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1969.1066587