Development of a new X-ray radiography system with 16 amorphous silicon linear sensors

Author

Takahashi, Hiroyuki ; Harada, Kazuhiro ; Nakazawa, Masaharu ; Hasegawa, Ken-ichi ; Mochiki, Koh-ichi ; Hayakawa, Yoshinori ; Inada, Tetsuo

Author_Institution

Dept. of Nucl. Eng., Tokyo Univ., Japan

Volume

40

Issue

6

fYear

1993

fDate

12/1/1993 12:00:00 AM

Firstpage

2026

Lastpage

2029

Abstract

An X-ray radiography system that uses multiple amorphous silicon linear sensors combined with a Gd₂O₂S phosphor sheet has been developed. Sixteen line sensors are aligned parallel with a spacing of 19 mm and are scanned 20 mm to cover an X-ray image. The scanning step is 0.5 mm and the accumulation time can be selected from 33 ms to 200 ms per one step. A total active area of 25.6 cm×30.0 cm with 512×608 pixels was realized. The practical problem with this system is the sensitivity variations among sensors. This problem was overcome by adopting a multilevel intensity calibration method with spatially uniform X-ray irradiation. The applicability of this system to X-ray radiography has been demonstrated through some medical applications

Keywords

X-ray applications; diagnostic radiography; medical image processing; semiconductor counters; silicon; Gd₂O₂S; Si; X-ray image; X-ray radiography system; accumulation time; medical applications; multilevel intensity calibration method; sensitivity variations; Amorphous materials; Amorphous silicon; Biomedical equipment; Calibration; Image sensors; Medical services; Phosphors; Radiography; Sensor systems; X-ray imaging;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.273448

Filename

273448