A low noise FET with integrated charge restoration for radiation detectors

Author

Nashashibi, T. ; White, G.

Author_Institution

Link Anal. Ltd., High Wycombe, UK

Volume

37

Issue

2

fYear

1990

fDate

4/1/1990 12:00:00 AM

Firstpage

452

Lastpage

456

Abstract

A novel pulsed, nonoptical, reset technique for use in charge-sensitive amplifiers and radiation detectors is described. The first-stage FET and charge restoration are integrated into one five-terminal device called the Pentafet. A pulse of minority carriers is injected directly into the channel of the FET. The technique is fast, and there are no aftereffects on the operation of the FET. Very low noise performance is achieved, even at high count rates. The high energy rate product capability of the device is demonstrated by analyzing Mn X-rays in the presence of high-energy electrons from an Sr-90 beta source and in a transmission electron microscope

Keywords

nuclear electronics; radiation detection and measurement; Mn X-rays; Pentafet; Sr-90 beta source; charge-sensitive amplifiers; count rates; five-terminal device; integrated charge restoration; low noise FET; minority carriers; radiation detectors; transmission electron microscope; FETs; Light emitting diodes; Optical amplifiers; Optical feedback; Optical noise; Optical pulses; Pulse amplifiers; Radiation detectors; Spectroscopy; X-rays;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.106661

Filename

106661