Title :
Single event phenomena in atmospheric neutron environments
Author :
Gossett, C.A. ; Hughlock, B.W. ; Katoozi, M. ; LaRue, G.S. ; Wender, S.A.
Author_Institution :
Boeing Defense & Space Group, Seattle, WA, USA
fDate :
12/1/1993 12:00:00 AM
Abstract :
Describes direct experimental measurements of neutron-induced single event effect (SEE) rates in commercial high-density static random access memories in a neutron environment characteristic of that at commercial airplane altitudes. The first experimental measurements testing current models for neutron-silicon burst generation rates are presented, as well as measurements of charge collection in silicon test structures as a function of neutron energy. These are the first laboratory SEE and charge collection measurements using a particle beam having a continuum energy spectrum and with a shape nearly identical to that observed during flight. Significant inaccuracies in the presently accepted models for predicting SEU rates in an atmospheric environment are noted, and an experimental basis for development of a more accurate model is provided
Keywords :
SRAM chips; charge measurement; integrated circuit testing; neutron effects; SEU rates; atmospheric neutron environments; charge collection; charge collection measurements; commercial airplane altitudes; neutron energy; neutron-induced single event effect; neutron-silicon burst generation rates; static random access memories; Atmospheric measurements; Atmospheric modeling; Charge measurement; Current measurement; Energy measurement; Neutrons; Particle beam measurements; Predictive models; Shape measurement; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on