Title :
Integration and Test Sequencing for Complex Systems
Author :
Boumen, Roel ; De Jong, Ivo S M ; Mestrom, J.M.G. ; van de Mortel-Fronczak, J.M. ; Rooda, J.E.
Author_Institution :
ASML Netherlands B.V., Veldhoven
Abstract :
The integration and test phase of complex manufacturing machines, like an ASML lithographic manufacturing system, is expensive and time consuming. The tests that can be performed at a certain point in time during the integration phase depend on the modules that are integrated and, therefore, on the preceding integration sequence. In this paper, we introduce a mathematical model to describe an overall integration and test sequencing problem, and we propose an algorithm to solve this problem. The method is a combination of integration sequencing and test sequencing. Furthermore, we introduce several strategies that determine when test phases should start. With a case study within the development of a software release that is used to control an ASML lithographic machine, we show that the described method and strategies can be used to solve real-life problems.
Keywords :
electronic engineering computing; integrated circuit manufacture; integrated manufacturing systems; large-scale systems; lithography; ASML lithographic manufacturing system; complex manufacturing machine; integration sequencing phase; mathematical model; test sequencing phase; Automatic testing; Electronics industry; Manufacturing systems; Mathematical model; Optimization methods; Performance evaluation; Semiconductor device manufacture; Semiconductor device testing; System testing; Time to market; Integration; manufacturing machines; semiconductor industry; test sequencing; test strategy;
Journal_Title :
Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on
DOI :
10.1109/TSMCA.2008.2006374