Title :
Thermal resistance measurement of avalanche diodes
fDate :
10/1/1971 12:00:00 AM
Abstract :
A new method of thermal resistance measurement is presented. The variation of diode breakdown voltage with input power as a function of time is the basis of the method. Diode space-charge resistance and series resistance together with separate components of heat-flow resistance are measured using this method. The technique of the measurement is straightforward and provides results with little ambiguity and high accuracy.
Keywords :
Atomic measurements; Capacitance; Circuits; Diodes; Electrical resistance measurement; Impurities; Resistance heating; Temperature; Thermal resistance; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1971.17312
