Level crossing rate and average fade duration of the double Nakagami-m random process and application in MIMO keyhole fading channels

Author

Zlatanov, Nikola ; Hadzi-Velkov, Zoran ; Karagiannidis, George K.

Author_Institution

Fac. of Electr. Eng. & Informaion Technol., Ss. Cyril & Methodius Univ., Skopje

Volume

12

Issue

11

fYear

2008

fDate

11/1/2008 12:00:00 AM

Firstpage

822

Lastpage

824

Abstract

We present novel exact expressions and accurate closed-form approximations for the level crossing rate (LCR) and the average fade duration (AFD) of the double Nakagami-m random process. These results are used to study the second order statistics of multiple input multiple output (MIMO) keyhole fading channels with space-time block coding. Numerical and computer simulation examples validate the accuracy of the presented mathematical analysis and show the tightness of the proposed approximations.

Keywords

MIMO communication; Nakagami channels; block codes; space-time codes; MIMO keyhole fading channels; average fade duration; double Nakagami-m random process; level crossing rate; multiple input multiple output; space-time block coding; Block codes; Computer simulation; Fading; MIMO; Mathematical analysis; Nakagami distribution; Random processes; Rayleigh channels; Scattering; Statistics; Level crossing rate (LCR), average fade duration (AFD); keyhole MIMO fading channels, Nakagami-m fading; multiplicative fading, cascaded fading;

fLanguage

English

Journal_Title

Communications Letters, IEEE

Publisher

ieee

ISSN

1089-7798

Type

jour

DOI

10.1109/LCOMM.2008.081058

Filename

4717981