• DocumentCode
    1041457
  • Title

    Thermal noise in the hot electron regime in FET´s

  • Author

    van der Ziel, A.

  • Volume
    18
  • Issue
    10
  • fYear
    1971
  • fDate
    10/1/1971 12:00:00 AM
  • Firstpage
    977
  • Lastpage
    977
  • Abstract
    Klaassen has given two different formulas for the thermal noise in the conducting channel of FETs in the hot electron regime. It is shown that the first published formula is formally correct. A discussion is given of the equivalent noise temperature of the hot electrons.
  • Keywords
    Conductors; Diodes; Electrons; FETs; Gunn devices; Noise measurement; Solid state circuits; Tellurium; Temperature; Thermal conductivity;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1971.17315
  • Filename
    1476637
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1041457