DocumentCode :
1041492
Title :
Displacement damage effects in mixed particle environments for shielded spacecraft CCDs
Author :
Dale, Cameron ; Marshall, Peter ; Cummings, Brent ; Shamey, Louis ; Holland, Andrew
Author_Institution :
US Naval Res. Lab., Washington, DC, USA
Volume :
40
Issue :
6
fYear :
1993
fDate :
12/1/1993 12:00:00 AM
Firstpage :
1628
Lastpage :
1637
Abstract :
Analysis of monoenergetic proton test data reveals displacement damage degradation of charge transfer efficiency in state-of-the-art charge coupled devices (CCDs). New measurements, in combination with literature data, demonstrate good agreement between the energy dependencies of proton damage and the nonionizing energy loss (NIEL) for protons in Si. Massive shields being considered to preserve CCD performance in satellites are analyzed using the transport code BRYNTRN, which quantifies both primary and secondary particle production. Using NIEL to combine the cumulative effects of both protons and neutrons reaching the CCD. Al and Ta shield approaches are compared for both trapped and flare proton environments. In general, massive Ta shields have diminished benefit owing to damage from large secondary neutron fluxes. Analysis with Shockley-Read-Hall theory demonstrates the importance of CCD operating conditions and transfer efficiency measurement techniques in evaluating flight performance and comparing results between devices and laboratories
Keywords :
CCD image sensors; aerospace instrumentation; neutron effects; proton effects; radiation hardening (electronics); shielding; Al shield; Shockley-Read-Hall theory; Si; Ta shield; charge transfer efficiency; displacement damage degradation; energy dependencies; flare proton environments; flight performance; mixed particle environments; monoenergetic proton test data; nonionizing energy loss; primary particle production; satellites; secondary particle production; shielded spacecraft CCDs; transfer efficiency measurement techniques; transport code BRYNTRN; trapped proton environment; Charge coupled devices; Charge transfer; Charge-coupled image sensors; Degradation; Energy measurement; Loss measurement; Neutrons; Performance analysis; Protons; Testing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.273497
Filename :
273497
Link To Document :
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