DocumentCode :
1041559
Title :
Quality control and monitoring of radiation damage in charge coupled devices at the Stanford Linear Collider
Author :
Robbins, M.S. ; Roy, T. ; Hedges, S.J. ; Holmes-Siedle, A. ; McKemey, A.K. ; Watts, S.J.
Author_Institution :
Brunel Univ., Uxbridge, UK
Volume :
40
Issue :
6
fYear :
1993
fDate :
12/1/1993 12:00:00 AM
Firstpage :
1561
Lastpage :
1566
Abstract :
The radiation testing of CCDs (charge coupled devices) for the vertex detector now installed at the SLAC (Stanford Linear Accelerator Center) Linear Collider is described. In addition to data from the batch qualification, results are also presented on the effect of biasing the CCDs during irradiation. A comparison between Co60 and Sr90 irradiation is made, and initial results for radiation effects in the vertex detector during operations are presented. It has been shown that commercial CCDs can be used as silicon tracking arrays in the radiation environment close to the interaction point at the SLC (SLAC Linear Collider). Measurements of reset FET turn-on potentials on the vertex detector in situ indicate an accumulated dose consistent with that extrapolated from remote dosimetry. Given the well-defined beam conditions that SLC now routinely maintains, these measurements indicate that the detector operation will not be significantly degraded during its lifetime
Keywords :
CCD image sensors; beta-ray effects; gamma-ray effects; quality control; radiation hardening (electronics); semiconductor counters; semiconductor device testing; Si tracking arrays; Stanford Linear Collider; accumulated dose; batch qualification; beta irradiation; charge coupled devices; effect of biasing; gamma irradiation; radiation damage; radiation testing; reset FET turn-on potentials; vertex detector; Charge-coupled image sensors; Gas detectors; Linear accelerators; Qualifications; Quality control; Radiation detectors; Radiation effects; Radiation monitoring; Strontium; Testing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.273504
Filename :
273504
Link To Document :
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