DocumentCode :
1041817
Title :
Model for space charge evolution and dose in irradiated insulators at high electric fields
Author :
Frederickson, A.R. ; Woolf, S. ; Garth, J.C.
Author_Institution :
USAF Phillips Lab., Hanscom AFB, MA, USA
Volume :
40
Issue :
6
fYear :
1993
fDate :
12/1/1993 12:00:00 AM
Firstpage :
1393
Lastpage :
1401
Abstract :
A method for calculating dose, charge deposition, current, and electric field profiles across a dielectric slab irradiated by 1-3 MeV electron beams has been developed. The model consists of following the electric field build-up with time. A sequence of Monte Carlo calculations for relativistic electrons moving in an electric field determines the motion of the high-energy electrons. This is coupled with electric field solutions using a 1-D electrostatic field code. As time proceeds, the profile of high-energy electron current changes as well as the dose deposition which affects the magnitude of the conduction currents. Several mechanisms for conduction in the dielectric are taken into account. The model predictions are compared with Kerr-effect electric field data on irradiated polymethylmethacrylate (PMMA) obtained by M. Hikita et al. (1988)
Keywords :
Monte Carlo methods; electric fields; electrical engineering computing; electron beam effects; high field effects; insulation testing; space charge; 1 to 3 MeV; 1-D electrostatic field code; Monte Carlo calculations; charge deposition; charge storage; dielectric slab; dose deposition; electric field build-up; electric field profiles; electron beam irradiation; high electric fields; high-energy electron current changes; irradiated insulators; irradiated polymethylmethacrylate; model; relativistic electrons; space charge evolution; time development; Charge measurement; Current measurement; Dielectrics and electrical insulation; Electric breakdown; Electric variables measurement; Electron beams; Helium; Predictive models; Slabs; Space charge;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.273526
Filename :
273526
Link To Document :
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