DocumentCode
1041831
Title
A portable planar Sr-90 irradiation setup for total dose testing of electronic devices
Author
Lifshitz, Y. ; Levinson, Jesse ; Noter, Y. ; Shamai, Y. ; Akkerman, A. ; Even, O. ; Zentner, A. ; Israeli, M. ; Gibrekhterman, A. ; Singer, L.
Author_Institution
Soreq NRC, Yavne, Israel
Volume
40
Issue
6
fYear
1993
fDate
12/1/1993 12:00:00 AM
Firstpage
1388
Lastpage
1392
Abstract
A portable irradiation setup using a planar Sr-90 source was built and characterized. The dose at various positions in this facility was experimentally determined with an accuracy better than 10%, as required by conventional standards. A calculation method was employed to evaluate both the energy spectrum and the dose-depth curve of the source. The agreement with experiment for depths larger than 0.5 mm Al is good. The RADFET dosimeter seems to give the best estimate for the surface dose. Irradiation of commercial delidded devices indicates that the planar β source gives results in excellent agreement with those obtained by Co-60 (γ) irradiations at equivalent doses. To avoid inaccuracy in dose estimation, the use of an Al (or other material) foil 0.1-0.15 g/cm2 thick between the source and delidded device was investigated. The portable irradiation setup can be very useful for irradiation of delidded devices at the prime or hybrid manufacturer or application specific integrated circuit (ASIC) user, permitting the use of their testing systems
Keywords
beta-ray effects; dosimetry; integrated circuit testing; radiation hardening (electronics); semiconductor device testing; test facilities; Al foil; RADFET dosimeter; delidded devices; dose-depth curve; electronic devices; energy spectrum; planar β source; planar 90Sr irradiation setup; portable irradiation setup; surface dose; total dose testing; Aluminum; Calibration; Dosimetry; Electron accelerators; Electronic equipment testing; Geometry; Instruction sets; Manufacturing; Safety; Silver;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.273527
Filename
273527
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