• DocumentCode
    1041859
  • Title

    An orthogonal simulated annealing algorithm for large floorplanning problems

  • Author

    Ho, Shinn-Ying ; Ho, Shinn-Jang ; Lin, Yi-Kuang ; Chu, William Cheng-Chung

  • Author_Institution
    Dept. of Biol. Sci., Nat. Chiao Tung Univ., Yunlin, Taiwan
  • Volume
    12
  • Issue
    8
  • fYear
    2004
  • Firstpage
    874
  • Lastpage
    877
  • Abstract
    The conventional simulated annealing with some random generation mechanism using the sequence-pair topological representation in block placement and floorplanning is effective for a very small number of modules (40-50). This paper proposes an orthogonal simulated annealing algorithm (OSA) with an efficient generation mechanism (EGM) for solving large floorplanning problems. EGM samples a small number of representative floorplans and then efficiently derives a high-performance floorplan by using a systematic reasoning method for the next move of OSA based on orthogonal experimental design. Furthermore, an improved swap operation is proposed which cooperates with EGM to make OSA efficient. Excellent experimental results using the Microelectronics Center of North Carolina and the Gigascale Systems Research Center benchmarks show that OSA performs better than existing methods for large floorplanning problems.
  • Keywords
    VLSI; design of experiments; integrated circuit layout; modules; simulated annealing; conventional simulated annealing; efficient generation mechanism; floorplanning problems; high performance floorplan; modules; orthogonal experimental design; orthogonal simulated annealing algorithm; random generation mechanism; sequence-pair topology; systematic reasoning method; Automation; Bioinformatics; Biological system modeling; Biology; Design for experiments; Design optimization; Microelectronics; Random number generation; Simulated annealing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2004.831464
  • Filename
    1316901