DocumentCode :
1041960
Title :
Optimal Selective Huffman Coding for Test-Data Compression
Author :
Kavousianos, Xrysovalantis ; Kalligeros, Emmanouil ; Nikolos, Dimitris
Author_Institution :
Univ. of Ioannina, Ioannina
Volume :
56
Issue :
8
fYear :
2007
Firstpage :
1146
Lastpage :
1152
Abstract :
Selective Huffman coding has recently been proposed for efficient test- data compression with low hardware overhead. In this paper, we show that the already proposed encoding scheme is not optimal and we present a new one, proving that it is optimal. Moreover, we compare the two encodings theoretically and we derive a set of conditions which show that, in practical cases, the proposed encoding always offers better compression. In terms of hardware overhead, the new scheme is at least as low-demanding as the old one. The increased compression efficiency, the resulting test-time savings, and the low hardware overhead of the proposed method are also verified experimentally.
Keywords :
Huffman codes; data compression; compression efficiency; low hardware overhead; optimal encoding scheme; optimal selective Huffman coding; test-data compression; test-time savings; Automatic test pattern generation; Automatic testing; Channel capacity; Decoding; Electronics industry; Hardware; Huffman coding; Industrial economics; Industrial electronics; System-on-a-chip; Embedded Testing Techniques; IP Cores; Selective Huffman Coding; Test-Data Compression;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.2007.1057
Filename :
4264327
Link To Document :
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