DocumentCode
1042000
Title
Design of built-in current sensors for concurrent checking in radiation environments
Author
Nicolaidis, M. ; Vargas, F. ; Courtois, B.
Volume
40
Issue
6
fYear
1993
fDate
12/1/1993 12:00:00 AM
Firstpage
1584
Lastpage
1590
Abstract
A technique for concurrently checking faults in static CMOS circuits is proposed. It performs concurrent monitoring of static current by means of built-in current sensors (BICS) and detects the leakage current that accompanies the parametric shifts. Using BICs also allows the selection of high-quality circuits during manufacturing testing, resulting in a higher mean time to failure
Keywords
CMOS integrated circuits; built-in self test; concurrent engineering; electric current measurement; integrated circuit testing; leakage currents; production testing; radiation effects; built-in current sensors; concurrent checking; high-quality circuits; leakage current; manufacturing testing; mean time to failure; parametric shifts; radiation environments; static CMOS circuits; Circuit faults; Circuit testing; Condition monitoring; Degradation; Electrical fault detection; Fault detection; Fault tolerant systems; Ionizing radiation; Leakage current; Logic;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.273553
Filename
273553
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