Title :
Comparison of electronics-reliability assessment approaches
Author :
Cushing, Michael J. ; Mortin, David E. ; Stadterman, Thomas J. ; Malhotra, Anupam
Author_Institution :
US AMSAA, Aberdeen Proving Ground, MD, USA
fDate :
12/1/1993 12:00:00 AM
Abstract :
Two general approaches available for assessing the reliability of electronics during design are device failure rate prediction, and physics-of-failure. This work broadly compares these two approaches in a way that is readily understandable by the wide range of readers concerned with the design, manufacture, and support of electronic equipment
Keywords :
circuit reliability; design engineering; electronics industry; failure analysis; testing; design; device failure rate prediction; electronics; manufacture; physics-of-failure; reliability assessment; Accuracy; Educational institutions; Electronic equipment; Electronic equipment manufacture; Electronic equipment testing; Europe; Hardware; Materials reliability; Physics; USA Councils;
Journal_Title :
Reliability, IEEE Transactions on
