Title :
Exact maximum likelihood estimation using masked system data
Author :
Lin, Dennis K J ; Usher, John S. ; Guess, Frank M.
Author_Institution :
Dept. of Stat., Tennessee Univ., Knoxville, TN, USA
fDate :
12/1/1993 12:00:00 AM
Abstract :
This work estimates component reliability from masked series-system life data, viz, data where the exact component causing system failure might be unknown. The authors extend the results of Usher and Hodgson (1988) by deriving exact maximum likelihood estimators (MLE) for the general case of a series system of three exponential components with independent masking. Their previous work shows that closed-form MLE are intractable, and they propose an iterative method for the solution of a system of three nonlinear likelihood equations
Keywords :
failure analysis; iterative methods; maximum likelihood estimation; reliability; component reliability; exact maximum likelihood estimation; iterative method; masked series-system life data; masked system data; nonlinear likelihood equations; Assembly systems; Associate members; Circuits; Closed-form solution; Failure analysis; Iterative methods; Life estimation; Maximum likelihood estimation; Nonlinear equations; Risk analysis;
Journal_Title :
Reliability, IEEE Transactions on
