DocumentCode :
1042287
Title :
Low-loss electrooptic BaTiO3 thin film waveguide modulator
Author :
Tang, Pingsheng ; Towner, D.J. ; Meier, Anthony L. ; Wessels, B.W.
Author_Institution :
Dept. of Mater. Sci., Northwestern Univ., Evanston, IL, USA
Volume :
16
Issue :
8
fYear :
2004
Firstpage :
1837
Lastpage :
1839
Abstract :
A strip-loaded electrooptic waveguide modulator based on an epitaxial BaTiO3 thin film was fabricated and characterized for the first time. The strip-loaded waveguide structure greatly improves waveguide propagation and polarization-dependent loss performance. A propagation loss of 1.1 dB/cm and polarization dependent loss of 0.1 dB/cm were measured. The electrooptic waveguide modulator exhibited a half-wave voltage-interaction length product of 4.5 V · cm at a wavelength of 1542 nm. The measured effective electrooptic coefficient of the as-grown BaTiO3 waveguide modulator was 38 pm/V. The experimental results indicate that a strip-loaded thin film waveguide modulator is suitable for photonic applications.
Keywords :
barium compounds; electro-optical effects; electro-optical modulation; epitaxial layers; light polarisation; optical fabrication; optical films; optical losses; optical waveguides; 4.5 nm; BaTiO3; as-grown BaTiO3 waveguide modulator; electrooptic coefficient; epitaxial BaTiO3 thin film; half-wave voltage-interaction length; low-loss electrooptic BaTiO3 thin film waveguide modulator; photonic applications; polarization dependent loss; propagation loss; strip loaded thin film waveguide modulator; strip-loaded electrooptic waveguide modulator; strip-loaded waveguide structure; waveguide propagation; Electrooptic modulators; Electrooptical waveguides; Loss measurement; Optical modulation; Performance loss; Polarization; Propagation losses; Transistors; Voltage; Wavelength measurement;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2004.831255
Filename :
1316940
Link To Document :
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