• DocumentCode
    1042338
  • Title

    A microwave-biased millimeter- and submillimeter- wave detector using InSb

  • Author

    Eldumiati, I.I. ; Haddad, George I.

  • Author_Institution
    Sensors, Inc., Ann Arbor, Mich.
  • Volume
    19
  • Issue
    2
  • fYear
    1972
  • fDate
    2/1/1972 12:00:00 AM
  • Firstpage
    257
  • Lastpage
    267
  • Abstract
    A high-purity n-type indium antimonide sample mounted in a reentrant cavity and cooled to 4.2°K was operated as a millimeter-wave detector. The scheme utilizes a downconversion process and free-carrier absorption is the mechanism responsible for the detection process. Power applied at the millimeter-wave frequency causes a change in the material conductivity which in turn causes a change in the X -band power absorption; cavity perturbation techniques are used to analyze the scheme. The detector was operated successfully at frequencies between 35 and 150 GHz with no long wavelength or short wavelength cutoff observed. The scheme offers a fast highly sensitive and rugged detector with low conversion loss.
  • Keywords
    Circuits; Conducting materials; Degradation; Detectors; Electromagnetic wave absorption; Frequency; Impedance; Indium; Microwave devices; Millimeter wave technology;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1972.17405
  • Filename
    1476876