DocumentCode
1042338
Title
A microwave-biased millimeter- and submillimeter- wave detector using InSb
Author
Eldumiati, I.I. ; Haddad, George I.
Author_Institution
Sensors, Inc., Ann Arbor, Mich.
Volume
19
Issue
2
fYear
1972
fDate
2/1/1972 12:00:00 AM
Firstpage
257
Lastpage
267
Abstract
A high-purity n-type indium antimonide sample mounted in a reentrant cavity and cooled to 4.2°K was operated as a millimeter-wave detector. The scheme utilizes a downconversion process and free-carrier absorption is the mechanism responsible for the detection process. Power applied at the millimeter-wave frequency causes a change in the material conductivity which in turn causes a change in the
-band power absorption; cavity perturbation techniques are used to analyze the scheme. The detector was operated successfully at frequencies between 35 and 150 GHz with no long wavelength or short wavelength cutoff observed. The scheme offers a fast highly sensitive and rugged detector with low conversion loss.
-band power absorption; cavity perturbation techniques are used to analyze the scheme. The detector was operated successfully at frequencies between 35 and 150 GHz with no long wavelength or short wavelength cutoff observed. The scheme offers a fast highly sensitive and rugged detector with low conversion loss.Keywords
Circuits; Conducting materials; Degradation; Detectors; Electromagnetic wave absorption; Frequency; Impedance; Indium; Microwave devices; Millimeter wave technology;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1972.17405
Filename
1476876
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