Title :
Calculation of electron drift velocity at Si avalanche
Author :
Chen, Peter C.Y.
Author_Institution :
University of Pittsburgh, Pittsburgh, Pa.
fDate :
2/1/1972 12:00:00 AM
Abstract :
In evaluating the electron drift velocity at Si avalanche, the electron distribution is obtained by solving the Boltzmann transport equation in the maximum anisotropy truncation (MAT) approximation of Baraff. Improvements are made to the MAT procedure so that the symmetrical part of the distribution function can be obtained in a straightforward manner. The temperature dependence of electron drift velocity is studied by including both optical phonon emission and absorption rather than emission alone. The calculated electron drift velocity varies from

to

cm/s at Si avalanche.
Keywords :
Anisotropic magnetoresistance; Boltzmann equation; Distribution functions; Electron emission; Electron mobility; Electron optics; Geometrical optics; Phonons; Stimulated emission; Temperature dependence;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1972.17408