• DocumentCode
    1042363
  • Title

    Calculation of electron drift velocity at Si avalanche

  • Author

    Chen, Peter C.Y.

  • Author_Institution
    University of Pittsburgh, Pittsburgh, Pa.
  • Volume
    19
  • Issue
    2
  • fYear
    1972
  • fDate
    2/1/1972 12:00:00 AM
  • Firstpage
    285
  • Lastpage
    286
  • Abstract
    In evaluating the electron drift velocity at Si avalanche, the electron distribution is obtained by solving the Boltzmann transport equation in the maximum anisotropy truncation (MAT) approximation of Baraff. Improvements are made to the MAT procedure so that the symmetrical part of the distribution function can be obtained in a straightforward manner. The temperature dependence of electron drift velocity is studied by including both optical phonon emission and absorption rather than emission alone. The calculated electron drift velocity varies from 1 \\times 10^{7} to 2.9 \\times 10^{7} cm/s at Si avalanche.
  • Keywords
    Anisotropic magnetoresistance; Boltzmann equation; Distribution functions; Electron emission; Electron mobility; Electron optics; Geometrical optics; Phonons; Stimulated emission; Temperature dependence;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1972.17408
  • Filename
    1476879