DocumentCode :
1042363
Title :
Calculation of electron drift velocity at Si avalanche
Author :
Chen, Peter C.Y.
Author_Institution :
University of Pittsburgh, Pittsburgh, Pa.
Volume :
19
Issue :
2
fYear :
1972
fDate :
2/1/1972 12:00:00 AM
Firstpage :
285
Lastpage :
286
Abstract :
In evaluating the electron drift velocity at Si avalanche, the electron distribution is obtained by solving the Boltzmann transport equation in the maximum anisotropy truncation (MAT) approximation of Baraff. Improvements are made to the MAT procedure so that the symmetrical part of the distribution function can be obtained in a straightforward manner. The temperature dependence of electron drift velocity is studied by including both optical phonon emission and absorption rather than emission alone. The calculated electron drift velocity varies from 1 \\times 10^{7} to 2.9 \\times 10^{7} cm/s at Si avalanche.
Keywords :
Anisotropic magnetoresistance; Boltzmann equation; Distribution functions; Electron emission; Electron mobility; Electron optics; Geometrical optics; Phonons; Stimulated emission; Temperature dependence;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1972.17408
Filename :
1476879
Link To Document :
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