DocumentCode
1042363
Title
Calculation of electron drift velocity at Si avalanche
Author
Chen, Peter C.Y.
Author_Institution
University of Pittsburgh, Pittsburgh, Pa.
Volume
19
Issue
2
fYear
1972
fDate
2/1/1972 12:00:00 AM
Firstpage
285
Lastpage
286
Abstract
In evaluating the electron drift velocity at Si avalanche, the electron distribution is obtained by solving the Boltzmann transport equation in the maximum anisotropy truncation (MAT) approximation of Baraff. Improvements are made to the MAT procedure so that the symmetrical part of the distribution function can be obtained in a straightforward manner. The temperature dependence of electron drift velocity is studied by including both optical phonon emission and absorption rather than emission alone. The calculated electron drift velocity varies from
to
cm/s at Si avalanche.
to
cm/s at Si avalanche.Keywords
Anisotropic magnetoresistance; Boltzmann equation; Distribution functions; Electron emission; Electron mobility; Electron optics; Geometrical optics; Phonons; Stimulated emission; Temperature dependence;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1972.17408
Filename
1476879
Link To Document