DocumentCode :
1042481
Title :
Threshold voltages of normally off MESFET´s
Author :
Jutzi, Wilhelm ; Reiser, Martin
Author_Institution :
IBM Zurich Research Laboratory, Rüschlikon, Switzerland
Volume :
19
Issue :
3
fYear :
1972
fDate :
3/1/1972 12:00:00 AM
Firstpage :
314
Lastpage :
322
Abstract :
The threshold voltage of "normally off" Si-MESFET\´s for simple dc-coupled circuits is defined and computed with a two-dimensional device model, taking into account carrier velocity saturation and diffusion. The influence of the main parameters, gate length, conducting-layer thickness, and doping is investigated outside the range of Shockley\´s equations. A threshold voltage of a MESFET with a 1-µm gate length U_{T} = 0.2 V±10 percent requires a conducting-layer thickness tolerance d =0.15 µm±3 percent.
Keywords :
Doping; Electrodes; Electron mobility; Equations; FETs; Insulation; MESFET circuits; Semiconductor process modeling; Substrates; Threshold voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1972.17420
Filename :
1476891
Link To Document :
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