Title :
Modeling of Programming and Read Performance in Phase-Change Memories—Part I: Cell Optimization and Scaling
Author :
Russo, Ugo ; Ielmini, Daniele ; Redaelli, Andrea ; Lacaita, Andrea L.
Author_Institution :
Italian Univ. Nanoelectron. Team, Milan
Abstract :
One of the major concerns for the feasibility of phase-change memories is the reduction of the programming current. To this aim, several efforts have been dedicated both on cell geometry and on material engineering. This paper addresses programming-current minimization by the optimization of the cell geometry and materials, programming-current scaling, and the tradeoff between programming and readout performances of the cell. A general procedure to find the optimum-cell geometry is proposed and applied to a prototype vertical cell. Then, the evolution of program and read performances through technology nodes is analyzed by numerical simulations with the aid of an analytical model, for both the isotropic- and nonisotropic-scaling approaches. The two scaling approaches are discussed and compared in terms of program and read cell performances. Finally, material optimization is considered for further program-read improvement.
Keywords :
optimisation; phase change materials; random-access storage; cell geometry; cell optimization; cell scaling; material engineering; nonisotropic scaling; numerical simulations; phase-change memories; programming performance; programming-current minimization; programming-current scaling; read performance; Analytical models; Design engineering; Electric resistance; Geometry; Nanoelectronics; Nonvolatile memory; Performance analysis; Phase change materials; Phase change memory; Resistance heating; Amorphous semiconductors; chalcogenide; device scaling; nonvolatile memories; phase-change memory (PCM);
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2007.911630