DocumentCode :
1042850
Title :
An overview and evaluation of anisotropically conductive adhesive films for fine pitch electronic assembly
Author :
Chang, David D. ; Crawford, Patricia A. ; Fulton, Joe A. ; McBride, Richard ; Schmidt, Maureen B. ; Sinitski, Raymond E. ; Wong, C.P.
Author_Institution :
Eng. Res. Center, AT&T Bell Labs., Princeton, NJ, USA
Volume :
16
Issue :
8
fYear :
1993
fDate :
12/1/1993 12:00:00 AM
Firstpage :
828
Lastpage :
835
Abstract :
Anisotropically conductive adhesive films (ACAFs), which provide electrical as well as mechanical interconnections for fine pitch applications, are discussed. The conductivity of ACAF materials is only in the Z-direction (perpendicular to the plane of the board), and electrical isolation is maintained in the X-Y plane. Currently, at least 15 ACAF materials are commercially available. The authors have developed a methodology for evaluating these materials for their mechanical and electrical properties and interconnection use in the 8 to 15-mil pitch range. In addition they characterized the materials according to their physical properties and cure characteristics. They detail the findings with a comparison of physical form to assembly/cure and final electrical properties. Data from scanning electron microscopy, thermal analysis of the ACAFs, and cure and assembly studies on mixed substrate test vehicles are included. Information on initial electrical testing and long-term reliability testing is given
Keywords :
adhesion; conducting polymers; electrical conductivity of solids; filled polymers; infrared spectra of organic molecules and substances; mechanical properties of substances; microassembling; packaging; polymer films; scanning electron microscope examination of materials; thermal analysis; 8 to 15 mil; ACAF materials; X-Y plane electrical isolation; Z-direction conductivity; anisotropically conductive adhesive films; conductivity; cure characteristics; electrical interconnection; electrical properties; electrical testing; evaluation methodology; fine pitch electronic assembly; long-term reliability testing; mechanical interconnection; mechanical properties; physical properties; scanning electron microscopy; thermal analysis; Anisotropic conductive films; Anisotropic magnetoresistance; Assembly; Conducting materials; Conductive adhesives; Conductivity; Mechanical factors; Scanning electron microscopy; Testing; Vehicles;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.273681
Filename :
273681
Link To Document :
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