Title :
Measurement of emitter and collector series resistances
Author :
Giacoletto, L.J.
Author_Institution :
Michigan State University, East Lansing, Mich.
fDate :
5/1/1972 12:00:00 AM
Abstract :
Emitter and collector series (extrinsic) resistances can be evaluated by measuring the open-circuited (floating) junction voltage as the other junction is forward biased. Evaluation can be carried out on either a point-by-point basis or with the aid of a curve tracer. Specific results are indicated for a 2N4400 transistor and an experimental transistor.
Keywords :
Circuits; Current measurement; Electrical resistance measurement; Oscilloscopes; Performance evaluation; Silicon; Sparks; Switches; Telephony; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1972.17476
