DocumentCode :
1043148
Title :
The distribution of gains in uniformly multiplying avalanche photodiodes: Theory
Author :
Mcintyre, Robert J.
Author_Institution :
RCA Ltd., Ste. Annede-Bellevue, P. Q., Canada
Volume :
19
Issue :
6
fYear :
1972
fDate :
6/1/1972 12:00:00 AM
Firstpage :
703
Lastpage :
713
Abstract :
Expressions are derived for the probability P_{n,m} that a pulse initiated by n electrons (or holes) in a uniformly multiplying semiconductor diode will result in a total number of electrons (or holes) m , to give a gain m/n , and for the probability Q_{n,m} that the gain will be m/n or greater. It is shown that the distributions are far from Gaussian. The gain distribution P_{1,m} for a single photoelectron, for example, is shown to have a maximum value for m = 1 for any value of the average gain M=m/n . The derivations are valid for any electric field distribution and assume only that the hole ionization coefficient \\beta (E ) can be approximated by the relation \\beta (E) =k\\alpha (E) , where \\alpha (E) is the electron ionization coefficient and k is a constant. A method of determining an effective value of k , for cases where \\beta =k\\alpha is not a good approximation, is presented. The results can be used to calculate the average gain and the mean square deviation from the average, giving results in agreement with previously published relations [1], [2]. The implications of this theory on the use of avalanche diodes for low-level photodetection are discussed. It is shown that in the near infrared, cooled avalanche photodiodes can compare favorably with the best available photomultiplier when used either in a photon-counting mode, or for the reliable detection of low-level laser pulses.
Keywords :
Avalanche photodiodes; Charge carrier processes; Electrons; Ionization; Laser modes; Laser noise; Low-frequency noise; Photomultipliers; Semiconductor device noise; Semiconductor diodes;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1972.17485
Filename :
1476956
Link To Document :
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