Title :
On the intrinsic Rent parameter and spectra-based partitioning methodologies
Author :
Hagen, Lars ; Kahng, Andrew B. ; Kurdahi, Fadi J. ; Ramachandran, Champaka
Author_Institution :
Dept. of Comput. Sci., California Univ., Los Angeles, CA, USA
fDate :
1/1/1994 12:00:00 AM
Abstract :
The complexity of circuit designs has necessitated a top-down approach to layout synthesis. A large body of work shows that a good layout hierarchy, or partitioning tree, as measured by the associated Rent parameter, will correspond to an area-efficient layout. We define the intrinsic Rent parameter of a netlist to be the minimum possible Rent parameter of any partitioning tree for the netlist. Experimental results show that spectra-based ratio cut partitioning algorithms yield partitioning trees with the lowest observed Rent parameter over all benchmarks and over all algorithms tested. For examples where the intrinsic Rent parameter is known, spectral ratio cut partitioning yields a partitioning tree with Rent parameter essentially identical to this theoretical optimum. These results have deep implications with respect to both the choice of partitioning algorithms for top-down layout, as well as new approaches to layout area estimation. The paper concludes with directions for future research, including several promising techniques for fast estimation of the (intrinsic) Rent parameter
Keywords :
VLSI; circuit layout CAD; combinatorial circuits; logic CAD; FM-1/4; FM-Bis; MCNC benchmark suite; Mesh2D; Mesh3D; Rand-Bis; RandMC; Spec-Bis; SpecRC; Struct; VLSI layout; intrinsic Rent parameter; layout area estimation; layout hierarchy; layout synthesis; netlist; partitioning tree; ratio cut partitioning algorithms; spectra-based partitioning methodologies; top-down approach; Binary trees; Circuit synthesis; Computer science; Design automation; Marine vehicles; Partitioning algorithms; Phase estimation; Recursive estimation; Testing; Very large scale integration;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on