• DocumentCode
    1043672
  • Title

    Transient Response Characteristics of Capacitive Potential Devices

  • Author

    Sweetana, Andrew

  • Author_Institution
    Westinghouse Electric Corporation
  • Issue
    5
  • fYear
    1971
  • Firstpage
    1989
  • Lastpage
    2001
  • Abstract
    Full voltage line to ground fault tests are performed on typical potential devices and the subsidence transient recorded. To show the worst case of residual voltage, faults are initiated while the primary voltage is passing through crest and zero.
  • Keywords
    Circuit analysis computing; Circuit faults; Circuit testing; Equivalent circuits; Oscilloscopes; Power system transients; Protective relaying; Switches; Transient response; Voltage;
  • fLanguage
    English
  • Journal_Title
    Power Apparatus and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9510
  • Type

    jour

  • DOI
    10.1109/TPAS.1971.292994
  • Filename
    4074557