Stochastic Estimation of Voltage Sags in a Large Meshed Network

Author

Park, Chang-Hyun ; Jang, Gilsoo

Author_Institution

Korea Univ., Seoul

Volume

22

Issue

3

fYear

2007

fDate

7/1/2007 12:00:00 AM

Firstpage

1655

Lastpage

1664

Abstract

This paper presents a method for stochastic prediction of voltage sags caused by faults in a power system. The area of vulnerability must be determined to estimate the expected sag frequency (ESF) at a sensitive load site. However, the area of vulnerability is not easy to identify in a large meshed network. In the paper, the residual phase voltage equations for balanced and unbalanced faults are presented, and an efficient method to determine the area of vulnerability in a large meshed network is described. An ESF estimation method based on information technology industry council (ITIC) curve is also described. The developed method was applied to the IEEE 30-bus test system.

Keywords

estimation theory; power supply quality; stochastic processes; ESF estimation; IEEE 30-bus test system; expected sag frequency; information technology industry council; large meshed network; residual phase voltage equations; stochastic estimation; voltage sags; Circuit faults; Equations; Fault location; Frequency estimation; Power quality; Power system faults; Protection; Stochastic processes; Threshold voltage; Voltage fluctuations; Area of vulnerability; power quality; stochastic assessment; voltage sags;

fLanguage

English

Journal_Title

Power Delivery, IEEE Transactions on

Publisher

ieee

ISSN

0885-8977

Type

jour

DOI

10.1109/TPWRD.2006.886795

Filename

4265714