Title :
The deflection sensitivity of traveling-wave electron-beam deflection structures
Author :
Silzars, A. ; Knight, R.
Author_Institution :
Watkins-Johnson Company, Palo Alto, Calif.
fDate :
11/1/1972 12:00:00 AM
Abstract :
A combination experimental-analytical method for easily determining the frequency-dependent deflection sensitivity of traveling-wave deflection structures is described. Experimental measurements have been made to verify the accuracy of the proposed method.
Keywords :
Eigenvalues and eigenfunctions; Electromagnetic fields; Electron devices; Electrostatics; Equations; Interpolation; Magnetic fields; Polynomials; Ray tracing; Space charge;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1972.17579
