• DocumentCode
    1044112
  • Title

    The deflection sensitivity of traveling-wave electron-beam deflection structures

  • Author

    Silzars, A. ; Knight, R.

  • Author_Institution
    Watkins-Johnson Company, Palo Alto, Calif.
  • Volume
    19
  • Issue
    11
  • fYear
    1972
  • fDate
    11/1/1972 12:00:00 AM
  • Firstpage
    1222
  • Lastpage
    1224
  • Abstract
    A combination experimental-analytical method for easily determining the frequency-dependent deflection sensitivity of traveling-wave deflection structures is described. Experimental measurements have been made to verify the accuracy of the proposed method.
  • Keywords
    Eigenvalues and eigenfunctions; Electromagnetic fields; Electron devices; Electrostatics; Equations; Interpolation; Magnetic fields; Polynomials; Ray tracing; Space charge;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1972.17579
  • Filename
    1477050
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1044112