Author :
Bollesen, Vernon P.
Author_Institution :
Control Data Corporation, St. Paul, Minn.
fDate :
9/1/1970 12:00:00 AM
Keywords :
Magnetic core memories; Aerospace engineering; Aging; Assembly; Automatic testing; Circuit testing; Costs; Economics; Lead; Magnetic cores; Wire;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1970.1066892
