Delay time measurement in transition metal oxide glass devices

The switching delay times for transition metal oxide glass devices vary from operation to operation. However, a statistical treatment of delay time measurements has revealed the voltage dependence of the delay times and the existence of a well-defined threshold voltage for all of the devices tested. The effect of the switch-OFF history on the performance of the devices has also been investigated. Measurements of the transition metal oxide devices are compared with similar work on chalcogenide devices.