DocumentCode :
1044571
Title :
Non-Gaussian Statistical Timing Analysis Using Second-Order Polynomial Fitting
Author :
Cheng, Lerong ; Xiong, Jinjun ; He, Lei
Author_Institution :
Dept. of Electr. Eng., Univ. of California at Los Angeles, Los Angeles, CA
Volume :
28
Issue :
1
fYear :
2009
Firstpage :
130
Lastpage :
140
Abstract :
For nanometer manufacturing, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus developed to estimate timing distribution under process variation. Most existing SSTA techniques have difficulty in handling the non-Gaussian variation distribution and nonlinear dependence of delay on variation sources. To address this problem, we first propose a new method to approximate the max operation of two non-Gaussian random variables through second-order polynomial fitting. With such approximation, we then present new non-Gaussian SSTA algorithms for three delay models: quadratic model, quadratic model without crossing terms (semiquadratic model), and linear model. All the atomic operations (max and sum) of our algorithms are performed by closed-form formulas; hence, they scale well for large designs. Experimental results show that compared to the Monte Carlo simulation, our approach predicts the mean, standard deviation, skewness, and 95% percentile point within 1%, 1%, 6%, and 1% error, respectively.
Keywords :
Monte Carlo methods; network analysis; polynomial approximation; statistical analysis; timing; Monte Carlo simulation; circuit performance verification; nanometer manufacturing; nonGaussian random variables; nonGaussian statistical timing analysis; nonGaussian variation distribution; process variation; second-order polynomial fitting; timing distribution; Algorithm design and analysis; Approximation algorithms; Circuit optimization; Delay; Fitting; Manufacturing processes; Polynomials; Random variables; Timing; Uncertainty; Spatial correlation; statistical static timing analysis (SSTA); timing analysis; yield modeling;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2008.2009143
Filename :
4723641
Link To Document :
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