Title :
Evaluating Pulling Effects in Oscillators Due to Small-Signal Injection
Author :
Maffezzoni, Paolo ; Amore, Dario D.
Author_Institution :
Dipt. di Elettron. e Inf., Politec. di Milano, Milan
Abstract :
This paper presents a hybrid numerical-analytical approach to evaluate and quantify injection pulling effects in RF oscillators. The method employs the Floquet nu1(t) eigenvector to project the perturbation signal into the phase domain. An original closed-form expression for the frequency shift induced by small-signal harmonic perturbations is derived. It is shown that such closed-form expression accurately predicts frequency shift under weak pulling, quasi-lock, as well as locked conditions. An estimation of the main spectrum components of the pulled response is also derived. The proposed macromodeling approach has the peculiarity to be applicable to any oscillator topology.
Keywords :
injection locked oscillators; perturbation theory; radiofrequency oscillators; Floquet eigenvector; RF oscillators; frequency shift; injection pulling effects; macromodeling; phase domain; small-signal harmonic perturbations; Circuit topology; Closed-form solution; Equations; Injection-locked oscillators; Integrated circuit reliability; Power amplifiers; Radio frequency; Radiofrequency amplifiers; Transmitters; Wireless communication; Injection locking; RF oscillator reliability; injection pulling; oscillator phase-domain macomodeling; perturbation projection vector (PPV);
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2008.2009142