Title :
Chalcogenide glass bistable resistivity (Ovonic) memories
Author :
Pohm, A.V. ; Sie, C.H. ; Uttecht, R.R. ; Kao, V. ; Agrawal, O.
Author_Institution :
Iowa State University, Ames, Iowa
fDate :
9/1/1970 12:00:00 AM
Keywords :
Semiconductor memories; Conductivity; Crystallization; Electric resistance; Glass; Heating; Immune system; Read-write memory; Silicon; Tellurium; Thermal resistance;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1970.1066920
