DocumentCode
1044648
Title
An On-the-Fly Parameter Dimension Reduction Approach to Fast Second-Order Statistical Static Timing Analysis
Author
Feng, Zhuo ; Li, Peng ; Zhan, Yaping
Author_Institution
Dept. of Electr. & Comput. Eng, Texas A&M Univ., College Station, TX
Volume
28
Issue
1
fYear
2009
Firstpage
141
Lastpage
153
Abstract
While first-order statistical static timing analysis (SSTA) techniques enjoy good runtime efficiency desired for tackling large industrial designs, more accurate second-order SSTA techniques have been proposed to improve the analysis accuracy, but at the cost of high computational complexity. Although many sources of variations may impact the circuit performance, considering a large number of inter- and intra-die variations in the traditional SSTA is very challenging. In this paper, we address the analysis complexity brought by high parameter dimensionality in SSTA and propose an accurate yet fast second-order SSTA algorithm based on novel on-the-fly parameter dimension reduction techniques. By developing a reduced rank regression (RRR)-based approach and a method of moments (MOM)-based parameter reduction algorithm within the block-based SSTA flow, we demonstrate that accurate second-order SSTA can be extended to a much higher parameter dimensionality than what is possible before. Our experimental results have shown that the proposed parameter reductions can achieve up to 10times parameter dimension reduction and lead to significantly improved second-order SSTA under a large set of process variations.
Keywords
method of moments; network analysis; regression analysis; timing; circuit performance; computational complexity; method of moments; on-the-fly parameter dimension reduction approach; parameter dimensionality; parameter reduction algorithm; reduced rank regression; runtime efficiency; second-order statistical static timing analysis; Algorithm design and analysis; Circuit optimization; Computational complexity; Computational efficiency; Computer industry; Linear approximation; Performance analysis; Principal component analysis; Runtime; Timing; Reduced rank regression; statistical parameter dimension reduction; statistical static timing analysis;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2009.2009148
Filename
4723648
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