• DocumentCode
    1044834
  • Title

    The silicon cold cathode

  • Author

    Kohn, Elliott S.

  • Author_Institution
    RCA Corporation, Princeton, N. J.
  • Volume
    20
  • Issue
    3
  • fYear
    1973
  • fDate
    3/1/1973 12:00:00 AM
  • Firstpage
    321
  • Lastpage
    329
  • Abstract
    Cold cathode emission has been obtained from forward-biased silicon p-n junctions whose p-surfaces were activated to a state of negative electron affinity. In operation, electrons injected into the p-layer diffuse to the surface where they are emitted into vacuum. An Si:SiO2structure has been developed to overcome the problems associated with current crowding, and with this structure, efficiencies (ratio of emitted current to bias current) as high as 10 percent have been observed. Emitted current densities as large as 225 A/cm2and currents as large as 7 mA have been drawn under pulsed conditions, while continuous current densities of 2 A/cm2and currents of tens of microamperes have been drawn for many hours. The electrical characteristics exhibited space-charge-limited and emission-limited regimes as well as Schottky effect. The silicon cold cathode has advantages in applications such as vidicons, where some aspects of performance are presently limited by the thermionic cathode, and where power consumption and heat generation must be minimized.
  • Keywords
    Cathodes; Current density; Electron beams; Electron emission; Fabrication; P-n junctions; Proximity effect; Schottky barriers; Silicon; Tunneling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1973.17646
  • Filename
    1477303