DocumentCode
1044869
Title
Carrier concentration from MIS C-V measurements
Author
Pauwels, H.J.
Volume
20
Issue
3
fYear
1973
fDate
3/1/1973 12:00:00 AM
Firstpage
332
Lastpage
333
Abstract
By means of a graphical method the bulk carrier concentration can be deduced from the minimum normalized capacitance of a MIS structure with an arbitrary semiconductor, insulator, and insulator thickness.
Keywords
Amplitude modulation; Capacitance-voltage characteristics; Frequency; Insulation; Laboratories; Liquid crystal displays; Liquid crystals; Optical modulation; Pulse modulation; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1973.17650
Filename
1477307
Link To Document