Title :
Electron microscopy on high coercive force Co-Cr Films
Author_Institution :
Laboratoire d́Electronique et de Téchnologie de ĺInformatique Centre d́Etude Nucleaires, France.
fDate :
9/1/1970 12:00:00 AM
Keywords :
Anisotropic magnetoresistance; Chromium; Coercive force; Electron microscopy; Magnetic analysis; Magnetic anisotropy; Magnetic films; Magnetic particles; Magnetization reversal; Shape;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1970.1066941