Title :
Electrodeposited closed-flux memory
Author_Institution :
Ampex Corporation, Redwood City, California, USA
fDate :
9/1/1970 12:00:00 AM
Keywords :
Circuit noise; Crosstalk; Magnetic confinement; Magnetic noise; Magnetization; Noise cancellation; Power cables; Signal analysis; Testing; Wires;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1970.1066951
