• DocumentCode
    1045226
  • Title

    Comments on "A linear-sweep MOS-C technique for determining minority carrier lifetimes"

  • Author

    Grinthal, E.T.

  • Author_Institution
    IBM Corporation, Hopewell Junction, N. Y.
  • Volume
    20
  • Issue
    5
  • fYear
    1973
  • fDate
    5/1/1973 12:00:00 AM
  • Firstpage
    508
  • Lastpage
    508
  • Abstract
    Statements in the above paper1regarding quantitative agreement between theory and experiment are elaborated on, and a simplified graphical method for calculating the lifetime is presented.
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1973.17682
  • Filename
    1477339
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1045226