Title :
Comments on "A linear-sweep MOS-C technique for determining minority carrier lifetimes"
Author_Institution :
IBM Corporation, Hopewell Junction, N. Y.
fDate :
5/1/1973 12:00:00 AM
Abstract :
Statements in the above paper1regarding quantitative agreement between theory and experiment are elaborated on, and a simplified graphical method for calculating the lifetime is presented.
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1973.17682
