• DocumentCode
    1045371
  • Title

    Angular Dependence of Single Event Sensitivity in Hardened Flip/Flop Designs

  • Author

    Baze, M.P. ; Hughlock, Barrie ; Wert, J. ; Tostenrude, Joe ; Massengill, Lloyd ; Amusan, Oluwole ; Lacoe, Ronald ; Lilja, Klas ; Johnson, Mike

  • Author_Institution
    Boeing Phantom Works, Seattle, WA
  • Volume
    55
  • Issue
    6
  • fYear
    2008
  • Firstpage
    3295
  • Lastpage
    3301
  • Abstract
    SEU data on 90 nm structures displays a strong dependence on incident angle. A right parallelepiped (RPP) approximation is clearly not applicable to the observed response. This paper presents the data, possible mechanisms, and implications for testing and error rate predictions.
  • Keywords
    flip-flops; angular dependence; error rate predictions; hardened flip-flop designs; right parallelepiped approximation; single event sensitivity; Azimuth; CMOS technology; Flip-flops; Implants; Laboratories; Rails; Single event upset; Testing; Topology; Variable structure systems; Dual interlocked storage cell (DICE); flip-flop; linear energy transfer (LET); propagation; single event upset (SEU);
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2008.2009115
  • Filename
    4723728
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1045371