• DocumentCode
    1045414
  • Title

    Single-Event Effect Mitigation in Switched-Capacitor Comparator Designs

  • Author

    Olson, Brian D. ; Holman, W. Timothy ; Massengill, Lloyd W. ; Bhuva, Bharat L. ; Fleming, Patrick R.

  • Author_Institution
    Electr. Eng. & Comput. Sci. Dept., Vanderbilt Univ., Nashville, TN
  • Volume
    55
  • Issue
    6
  • fYear
    2008
  • Firstpage
    3440
  • Lastpage
    3446
  • Abstract
    A radiation-hardened-by-design (RHBD) technique is described for reducing errors due to single-event effects at the floating input nodes of a switched-capacitor comparator. The technique is shown to significantly outperform the alternative ldquobrute forcerdquo design choice of increasing capacitor size.
  • Keywords
    CMOS digital integrated circuits; comparators (circuits); CMOS; brute force design; radiation-hardened-by-design technique; single-event effect mitigation; switched-capacitor comparator designs; Circuit simulation; Circuit testing; Circuit topology; Clocks; Latches; Network topology; Power dissipation; Redundancy; Switched capacitor circuits; Voltage; Comparator; RHBD; radiation-hardened-by-design; single-event; switched-capacitor circuits;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2008.2006895
  • Filename
    4723733
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1045414